BIRD 210 Test Bench

Precision testing for modern electro-optics detectors

The BIRD 210 is a versatile and electro-optical test bench engineered to evaluate all types of detectors, particularly CMOS-based systems. It integrates ultra-low noise electronics with high-precision optical stimuli to deliver accurate and repeatable test results.

The BIRD 210 Test Bench offers a complete solution for evaluating detector performance with an intuitive interface, low-noise electronics, and motorized control of optical components. Ideal for laboratories and R&D environments requiring high-accuracy data on detector characteristics.

DOWNLOADContact us

BIRD 210 System for CMOS Detectors

MAIN BENEFITS

UNIVERSAL COMPATIBILITY

Test virtually any CMOS or similar detector architecture

SIMPLIFIED CONFIGURATION

Full control over pixel mapping, signal timing, and test settings

REPEATABLE & REPRODUCIBLE RESULTS

Consistent testing under precise optical and electrical conditions

FLEXIBLE TEST CRITERIA

Define thresholds for bad pixel mapping, spectral bands, temperature ranges, and more

OPTIMIZED PERFORMANCE TESTING

Adjust bias voltages in real time for best responsivity and minimal noise

COMPLETE DATA MANAGEMENT

Record and export results for analysis, traceability, and reporting

Available options and accessories

  • Stabilized Blackbody sources – For high-precision NETD and non-uniformity testing
  • IR monochromator – Adjustable spectral IR source for detailed response testing
  • Precision mechanical stages – Automated translation for alignment and measurement
  • Pinhole and slit targets – For high-resolution MTF and crosstalk analysis
  • Signal interface modules – Adaptable to various detector types and interfaces
  • INFRATEST Software Suite – Advanced configuration, acquisition, and test result reporting

BIRD 210 test bench

KEY FEATURES

Ultra-low noise electronics
Includes clock signal generator
bias voltage control and
high-frequency A/D converterr
Calibrated optical stimuli:
Uniform IR blackbody
for NETD and other noise testing
Complete detector interface:
Easily define and apply
custom clock, bias voltages,
and A/D parameters

Real-time signal acquisition:
Optimizes detector settings
cuwith feedback on noise
and responsivity
Integrated INFRATEST test software
Visualize, record, and analyze
all results from a central platform

Main applications of the BIRD 210 Test Bench

  • Noise tests: fixed pattern noise, temporal noise, NETD, responsivity, detectivity, 3D-noise, 2D-detectivity
  • Dynamic range, linearity
  • Non-uniformity correction
  • Bad pixel localisation
  • Spectral response
  • Crosstalk, MTF

Interested? Get in touch !

Looking for a high-precision platform for CMOS and other electro-optical detector testing? Contact us to learn more about how the BIRD 210 can meet your testing and R&D requirements.

Contact usDownload

Electro Optical Test Solutions

See all the videos

References

References